You have arrived on the Request for Quote (RFQ) page for part number 717801321-001, a Lockheed Martin Corporation component that is listed with the product description “Semiconductor Devices Unitized” and NSN 5961-01-302-7880 for fast identification. By using the form supplied below, you can offer details regarding your requirements to secure customized procurement solutions for your consideration. As our goal is to provide quick service, you can expect a response within 15 minutes of our staff members reviewing your submission. Alternatively, if you use the email or phone number at the bottom of the webpage, you can directly connect with our experts to discuss your needs.
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Alongside Lockheed Martin Corporation part number 717801321-001, you can seamlessly search for more items from this manufacturer or CAGECode 04939 using our curated catalogs. Similarly, we also offer means for locating other products that belong to FSC 5961 Semiconductor Devices and Associated Hardware, which this component falls under having the NSN 5961-01-302-7880. Whether you desire part number 717801321-001 or other NSN components, you can rest assured that our entire inventory is sourced from reputable manufacturers and suppliers. Bearing this in mind, kick off procurement today to see why so many customers select Aero Defence Solutions as their trusted purchasing hub.
| NSN | FSC | NIIN | CLS | Hazmat | DEMIL | Cancelled NSN |
|---|---|---|---|---|---|---|
| 5961-01-302-7880 Item PartTypeName: SEMICONDUCTOR DEVICES,UNITIZED | 5961 | 013027880 | 0 | N | B | |
| CIIC | HCC | ESD | PMIC | Criticality | ENAC | |
| U | B | A | ||||
| Part Number | ISC | RNVC | RNCC | HCC | MSDS | SADC |
| 20655 | 5 | 2 | 5 |
| MRC | Criteria | Characteristic |
|---|---|---|
| ABBH | INCLOSURE MATERIAL | CERAMIC |
| ABHP | OVERALL LENGTH | 0.358 INCHES MAXIMUM |
| ABKW | OVERALL HEIGHT | 0.100 INCHES MAXIMUM |
| ABMK | OVERALL WIDTH | 0.358 INCHES MAXIMUM |
| ASKA | COMPONENT NAME AND QUANTITY | 2 SEMICONDUCTOR DEVICE DIODE AND 2 TRANSISTOR |
| AXGY | MOUNTING METHOD | PRESS FIT |
| CTMZ | SEMICONDUCTOR MATERIAL | SILICON ALL SEMICONDUCTOR DEVICE DIODE |
| CTMZ | SEMICONDUCTOR MATERIAL | SILICON ALL TRANSISTOR |
| CTQN | VOLTAGE RATING IN VOLTS PER CHARACTERISTIC | 0.9 MAXIMUM FORWARD VOLTAGE,DC ALL SEMICONDUCTOR DEVICE DIODE |
| CTQN | VOLTAGE RATING IN VOLTS PER CHARACTERISTIC | 15.0 MAXIMUM DRAIN TO SOURCE VOLTAGE ALL TRANSISTOR |
| CTQX | CURRENT RATING PER CHARACTERISTIC | 100.00 MICROAMPERES MAXIMUM FORWARD CURRENT,DC ALL SEMICONDUCTOR DEVICE DIODE |
| CTQX | CURRENT RATING PER CHARACTERISTIC | 175.00 MILLIAMPERES MAXIMUM ZERO-GATE-VOLTAGE DRAIN CURRENT ALL TRANSISTOR |
| CTSG | MAXIMUM OPERATING TEMP PER MEASUREMENT POINT | 200.0 DEG CELSIUS JUNCTION |
| FEAT | SPECIAL FEATURES | ALL SEMICONDUCTOR DEVICE DIODE JUNCTION PATTERN ARRANGEMENT: PN |
| TTQY | TERMINAL TYPE AND QUANTITY | 20 UNINSULATED WIRE LEAD |
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